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SII NanoTechnology USA
Inc. is an instrument development company
dedicated to the research, development and commercialization of X-ray
detectors and spectrometric systems.
SII
NanoTechnology USA Inc. will, in addition to application
support and maintenance, continue the support and distribution
of existing products. These include measurement and analysis
instruments such as their focused ion beam systems and
fluorescent X-ray analyzers.
Vortex® Specifications and Perfromance
Data:
(Download PDF)
Customer Satisfaction Survey 2008 SII NanoTechnology USA
continually strives to deliver products and
services of the highest quality. Please click here
to complete our survey, and to enter a drawing for an iPod
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- X-ray spectroscopy
- X-ray fluorescence measurements
- X-ray microscopy and x-ray analysis
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Synchrotron radiation
applications
- Process control
- Environmental monitoring
- Spent fuel measurement and verification
- Vortex®,
a large area (50 mm2) SDD for X-ray spectroscopy
- Vortex-EX®,
a large area (50 mm2) SDD for X-ray spectroscopy and synchrotron radiation applications, with an extended probe (60 mm and 90 mm)
- Vortex-EM®,
a large area (50 mm2) SDD for
electron beam instrumentation, elemental mapping
and synchrotron radiation applications,
with a 300 mm long probe
- Vortex-ME4,
New!
four (4)-element silicon drift detector (SDD) X-ray detection
system with a total active area of 170mm2,
offering superior energy resolution and high throughput
performance
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