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SII NanoTechnology USA
Inc. is an instrument development company dedicated to
the research, development and commercialization of X-ray
detectors and spectrometric systems.
SII
NanoTechnology
USA Inc. will, in addition to application
support and maintenance, continue the support and distribution of
existing products. These include measurement and analysis instruments such as their
focused ion beam systems and fluorescent X-ray analyzers.
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| X-ray Detectors |
Silicon drift detectors and spectrometers for fluorescent X-ray and scanning electron microscopes, featuring LN2 free, high resolution and high count rate.
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| XRF Analysis |
Lineup of XRF analyzers, commanding attention in use in environmental field. WEEE&RoHS, ELV compliant types and soil investigation type are also available.
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| XRF Coating Thickness Gauge |
Lineup of SFT9000 series, covering standard type to high-grade type with dual-detector.
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