2008 Conference & Trade Show Participation
X-Ray Analyzers and Coating Thickness Gauges
Silicon Drift
Detectors
CES
Las Vegas, Nevada
January 7 - January 10
Pittcon
New Orleans, Louisiana
March 1 - March 7
IPC PCB Expo
Las Vegas, Nevada
April 1 - April 3
Scanning
(NIST) Bethesda, Maryland
April 14 - April 17
Del Mar Electronics Show
Del Mar, San Diego
April 30 - May 1
APS Users Meeting
Argonne, Illinois
May 5 - May 9
NSLS Users Meeting
Brookhaven, New York
May 19 - May 21
Applications of Nuclear
Techniques
Crete, Greece
June 8 - June 14
MEDSI/Pan-American
SRI 2008 Meeting
Saskatoon, Saskatchewan, Canada
June 10 - June 13
SUR/FIN
Indianapolis, Indiana
June 16 - June 18
European Conference on
X-Ray Spectroscopy
Dubrovnik, Croatia
June 16 - June 20
Semicon West
San Francisco, California
July 15 - July 17
Microscopy &
Microanalysis
Albuquerque, New Mexico
August 03 - August 07
Denver X-Ray Conference
Denver, Colorado
August 4 - August 8
IEEE Nuclear Science
Symposium & Medical Imaging Conference
Dresden, Germany
October 19 - October 25
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