Vortex-EX® silicon drift X-ray detectors feature the largest active area single element detector (50 mm2) available of its kind. Vortex-EX® detectors are produced from high purity silicon using state- of-the-art CMOS production technology. They feature excellent energy resolution (<136 eV FWHM at Mn Kα is typical) and a high count rate capability (input rate >1 Mcps). At a very short peaking time of 0.25 µs, an output count rate of 600 kcps is achieved. A unique feature of these detectors is their ability to process high count rates with virtually zero loss in energy resolution and no peak shift with count rate.

Typical Applications

• X-ray fluorescence (XRF) spectroscopy – both bulk and micro-fluorescence
• X-ray diffraction (XRD) and fluorescence (XRF)
• Synchrotron radiation applications
• Process control

The Vortex-EX^® is operated at near room temperature and cooled by a thermoelectric cooler (TEC) and can be cycled as frequently as needed without any degradation in detector performance. Cool down times are typically less than 3 minutes.

The Vortex-EX^® X-ray spectroscopy system includes a detector unit and control box, which includes power supplies for the detector and TEC, a digital pulse processor with PI-SPEC Software.

The complete detector also contains a charge-sensitive preamplifier and temperature stabilization system, which eliminates concerns of varying ambient temperature.

Features

• Extended probe (60 mm and 90 mm)
• Large area, single-element silicon drift detector (~50 mm²)
• Superb energy resolution
• Detector temperature stabilization
• Additional sizes are available under
  special contracts
• Small and compact package for minimum vibration
• Digital pulse processor (DPP) with PI-SPEC Software