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| XRF Coating Thickness Measurements |
Total
5 Products |
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SFT9100 Series |
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Fluorescent X-ray Coating Thickness Gauge
Monitor |
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A coating thickness gauge that uses fluorescent X-rays, this device performs highly accurate measurements of metal films using plating, deposition, sputtering, ion plating etc. Installation of new functions makes operating the instrument easier than ever. |
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SFT9200 Series |
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Fluorescent X-ray Coating Thickness Gauge |
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This is the standard model of our SFT-series of fluorescent X-ray coating thickness gauges. We offer SFT9200 for measurement of small parts and SFT9255 for large printed circuit boards. Anti-collision mechanism to prevent samples from colliding with the device is included as standard equipment in this series. |
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SFT9300 Series |
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Fluorescent X-ray Coating Thickness Gauge |
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The small high-powered X-ray tube installed in the SFT9300 enables measurements with high accuracy. The combination of the micro-collimator and the zoom type optical system enables measurement of submicroscopic areas of samples. This thickness gauge is also compliant with measurement of samples with irregular surface. |
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SFT9455 Series |
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Fluorescent X-ray Coating Thickness Gauge |
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SFT9455, the top model of the SFT9000 series, is a high performance thickness gauge that features a 75W high powered X-ray tube and a dual detector (semiconductor detector and proportional counter) and responds to all plate thickness measurement needs, including thin film, alloy film and submicroscopic measurements. In addition, SFT9455 can be used for qualitative analysis of extraneous substances and elemental analysis, as well as coating thickness measurement. |
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SFT9500 Series |
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Fluorescent X-ray Coating Thickness Gauge |
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Advanced x-ray microfocus technology has achieved high brilliance beam with an actual beam size of less than 0.1mm in diameter. Consequently, SFT9500 Series is capable of measurements of micro spots and thin film applications, such as lead frames, connectors, and flexible PCBs, that are difficult to measure with conventional models due to in sufficient fluorescent X-ray intensity from measurement samples. |
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